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LOGIC SIMULATION AND FAULT DIAGNOSIS

LOGIC SIMULATION AND FAULT DIAGNOSIS. BY JINS DAVIS ALEXANDER ELEC 7250 PRESENTATION. PROBLEM STATEMENT. To write a logic simulator to verify combinational circuits given a set of input vectors and the expected output responses.

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LOGIC SIMULATION AND FAULT DIAGNOSIS

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  1. LOGIC SIMULATION AND FAULT DIAGNOSIS BY JINS DAVIS ALEXANDER ELEC 7250 PRESENTATION ELEC7250: Alexander

  2. PROBLEM STATEMENT • To write a logic simulator to verify combinational circuits given a set of input vectors and the expected output responses. • To introduce a design error in the circuit and list the failing vectors and primary outputs where the errors are observed. • To diagnose the design error. ELEC7250: Alexander

  3. Logic Simulation. • Each PI , PO and gate were represented as a structure ( node). • PI’s , PO’s contained information like name, input vector values , expected response respectively. • Gate nodes also contained the fan-in list, fan-out list etc. • Simple search method was used to find out the fan-out connections to their respective gates. ELEC7250: Alexander

  4. START Create structures for the inputs , outputs and gates. Read input, output and gate data from simulation file into the structures. Initialize gate fan-in’s and fan-out’s to unknown X. Read the input vector and expected response from the stimuli file into input/output nodes Feed the input vector to their respective gate inputs. Simulate the gate fan-out output and propagate to primary outputs. YES Is any PO = ‘X’ ? NO Are all test vectors simulated? YES Are all PO’s =expected response? NO NO Diagnose fault and list failing vector and PO YES TERMINATE ELEC7250: Alexander

  5. Complexity • If net list is levelized , the complexity will be proportional to the number of gates. • Actual search complexity = N*N where N is number of gates. • Worst case scenario = depth of circuit * N*N. ELEC7250: Alexander

  6. Back Trace • Back trace - Possible error paths were listed by back tracing from PO’s , comparing the expected response with actual simulated response. • Since there could be a number of paths to a given erroneous PO, many good paths maybe considered erroneous by the simulator. • The actual error path is found to be detected the most number times by the test vectors. ELEC7250: Alexander

  7. Fault Dictionary • Using fault dictionary – Possible faults were listed for the given circuit along with test vectors that failed for that fault. • A failing test vector may give more than one possible fault. In such a case , the error path from back tracing can be used to pin point the actual fault. • For larger circuits , with larger fault dictionaries , a combination of back trace and fault dictionary can give better diagnosis resolution. ELEC7250: Alexander

  8. Results for a 4 bit Ripple Carry Adder ELEC7250: Alexander

  9. Results for ISCAS’85 circuits(simulated for 1000 random vectors) ELEC7250: Alexander

  10. Conclusion and Improvements. • Better search algorithms can give a simulation complexity of N where N is the number of gates. • Fault dictionary and back trace are useful methods for better diagnosis resolution. • Improvement – Redundant gate simulation can be removed to increase the speed. • Increase the number of faults in fault dictionary and to test for larger circuits. ELEC7250: Alexander

  11. THANK YOU . ELEC7250: Alexander

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