ROTAN

1. Daniel Šimek ROTAN Jan Drahokoupil Zbyněk Šourek Jiří Kub Václav Studnička the X-Ray laboratory Oliva Pacherová Marián Čerňanský Marie Trousilová Petr Veřtát

2. Equipment operated room120 • 3 open X-ray sources • Back scattered Laue method • Debye-Schrerer method • Bragg-Brentano HZG3 in reconstruction • X’Pert Pro vertical diffractometer • Bragg-Brentano (Co, Cu) with PSD • Parallel beam geometry (Co) • Texture accessory (limited liability range) • High temperature chamber (RT to 2200 ˚C) • Bruker D8 with rotating anode • Parallel beam geometry, Cu anode only • Set of three primary monochromators/collimators (Bartels) • Variable slit, parallel plate collimator or analyzers in diffracted beam • Eulerian cradle (chi, phi, X-Y-Z-stage) • Domed low-temerature chamber (-100 to +350 ˚C) • Rigaku Rotaflex rotating anode generator • Two diffractometers attached, Cu, Co, Mo • Parallel beam-geometry powder diffractometer Huber (Cu anode only) • 3 crystal single crystalline diffractometer BEDE • Fine focus open source (Cu anode) • instrumentation experiments (X-ray optics etc.) room046 room043

3. Single crystal services • Low resolution (Laue method)Marie Trousilová, Václav Studnička • Single crystal orientation determination • Orienting single crystals (for cutting etc.) • High resolution (epitaxial layers)Oliva Pacherová, Zbyněk Šourek, Jiří Kub • mutual orientation of layer/substrate • heteroepitaxy parameters (misfit → strain) • (multi)layer thicknesses, roughness • X-ray reflectivity also works for atomically smooth amorphous/polycrystalline (multi)layersOliva Pacherová, Daniel Šimek, Jiří Kub • thickness and roughness of (multi)layers Non-ambient-100 to +350 ˚C

4. Powder (polycryst.) services • Film methods (historical) • Debye Scherrer characterisation (crystal statistics) • Phase analysisJan Drahokoupil,Václav Studnička, Petr Veřtát • qualitative (phase recognition) of known inorganic phases in powder, polycrystals both bulk and thin layers • quantitative (phase fractions) for powders or non- or weak textured bulk polycrystals (Rietveld refinement) • phase transformations (e.g. with temperature) • Structure refinementJan Drahokoupil, Daniel Šimek, Petr Veřtát • Microstructure analysisJan Drahokoupil, Marián Čerňanský, Daniel Šimek, Petr Veřtát • grain sizes (<300 nm) • residual strain (thin layers, surface) • texture characterisation (liable for cubic symmetry) Non-ambientRT to +2200 ˚C(liable for powders)

5. Special (on-demand) • In-situ experiments (mechanical load) on polycrystaline samplesJan Drahokoupil,Petr Veřtát • Phase transformations under mechanical load • InstrumentationDaniel Šimek, Jiří Kub, Jan Drahokoupil • Statistical characterisation of grain sizes > 1 μm • Hi precision single-crystal orienting • Novelty crystallographic techniques (holography, diffuse scattering) • X-ray optics testingJiří Kub, Zbyněk Šourek • X-ray lens, optics prototyping

6. Summary • The (responsible) persons for particular techniques were introduced • Feel free to turn to them directly with your problems • If you are not sure to whom to turn, ask me to help you • If you think you would need (even in a future) something else, let me know.

7. Future?(we would like to purchase) • Texture diffractometer with 2D detector • reliable texture analysis of any material • grain statistics (equivalent to D-S method) • fast tracking of phase transformations (non/ambient, diffusion processes) • Pair distribution function characterisation (short-range ordered materials) • Microtomography with phase/diffraction contrast • non-destructive 3D imaging of voids, cracks, inclusions • non-destructive 3D grain boundaries imaging • non-destructive 3D grain orientation imaging • in-situ experiments (crack-growth, domain walls migration) • Improved Laue method (automated with CCD camera) • fast orienting and attaching to any holder, less trained personnel (anyone) • Hi-resolution diffractometer with beam collimated in both directions • in plane measurements, non-coplanar diffraction • small angle scattering on nano-sized objects Solid ’21 ? ?