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AMS Assertions … beyond analog waveform checking

AMS Assertions … beyond analog waveform checking. Mike Demler. Categories of AMS properties. Connectivity properties Static electrical properties Functional properties Signal properties I: Single-event temporal properties Signal properties II: Cumulative temporal properties

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AMS Assertions … beyond analog waveform checking

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  1. AMS Assertions… beyond analog waveform checking Mike Demler

  2. Categories of AMS properties • Connectivity properties • Static electrical properties • Functional properties • Signal properties I: • Single-event temporal properties • Signal properties II: • Cumulative temporal properties • Signal properties III: • Frequency domain properties • Mixed-signal interface properties

  3. Categories covered in initial proposal • Connectivity properties • Static electrical properties • Functional properties • Signal properties I: • Single-event temporal properties • Signal properties II: • Cumulative temporal properties • Signal properties III: • Frequency domain properties • Mixed-signal interface properties

  4. A Few ExamplesAnalog properties… that waveform checks miss • One of the most critical applications for mixed-signal verification is in SoC power management. • Functional verification of digitally-controlled power modes • How to verify consumption meets budget? • Integration of AMS IP • Is the power supply a signal?

  5. n3 (0,2.5V) Max=4 n7 n1 n2 (0,2.5V) Max=4 2.5V 1.2V 2.5V 1.2V n4 n8 n6 n5 (0,2.5V) Max=4 Analog properties… that waveform checks miss. • PROBLEM: • Multiple power domains. Low voltage inverter mistakenly connected to higher voltage drivers, “digitally” switched. • Output voltage waveform appears to be functionally correct. • assert property (V(G)<=1.2); ? • Requires device-level terminal property monitor. Vgs(Minimum, Maximum) NMOS

  6. 3.0 PDWN 3.0 3.0 DRIFT _PDWN Analog properties… that waveform checks miss. • PROBLEM: • Power down results in unexpectedly high power consumption. • Output waveform appears to be correct. Long time domain. • Requires device-level “X” (or high-Z) property monitor. 3.0 3.0 PDWN PDWN 3.0 3.0 Power Down 3.0 Hi-Z(0.0) 3.0 3.0 0.0 3.0 Seconds/Minutes _PDWN _PDWN

  7. Analog properties… that waveform checks miss. • PROBLEM: • DC paths result in wasted power. • Output voltage signals looks OK. • How to monitor supplies, DC terminal currents?

  8. AMS Assertions • Automation of time-domain signal analysis is valuable, but only covers a subset of important analog properties. • The waveform is not the circuit. • …and it is the circuit that must be verified. • Just as V-AMS LRM added SPICE constructs… • AMS assertions must also understand devices and circuits to provide adequate verification coverage.

  9. AMS Assertions • Previous examples are the most frequent causes of AMS SoC failures. • Recent customer quote: • “The following issues have caused silicon failures on our mixed-signal chips: floating gates, high voltage on single oxide transistors, level-shifter insertion…” • Failures occur most often because of the signal that wasn’t simulated! • Rarely because a simulated waveform could not be checked.

  10. Other Complex Analog Properties • From earlier preliminary discussion: • While ’a’ is true, the frequency of ’b’ is 100.0 Hz with a 1.0% tolerance. • The mean slew rate of ’a’ from 0.0 V to 5.0 V is 250.0 V/s with a 1.0% tolerance. • The −3 dB low pass cut-off frequency from ’a’ to ’b’ is 25 Hz with a tolerance of 2.5%. • The gain-bandwidth product from ’a’ to ’b’ is 2.5 MHz with a tolerance of 1.0%. • Let T1 and T2 be two sets of crossing times of various signals. Check that (maxT1 −minT1)+(maxT2 −minT2) < 2 max jitter . • (eye jitter)

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