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Nanonics NSOM/SPM Systems Are The Only Scanned Probe Microscopes :

Nanonics Renishaw NSOM/Raman Combination 12.01.2003. Nanonics NSOM/SPM Systems Are The Only Scanned Probe Microscopes :. Capable Of Being Integrated With

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Nanonics NSOM/SPM Systems Are The Only Scanned Probe Microscopes :

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  1. Nanonics Renishaw NSOM/Raman Combination 12.01.2003 Nanonics NSOM/SPM Systems Are The Only Scanned Probe Microscopes : Capable Of Being Integrated With • Renishaw Standard microRaman Systems which, like all microRaman systems, are generally based on upright microscopes which are preferred for their high light throughput Capable Of Being Used to Obtain: • Patented Shadow NSOM RamanTM & Scattering NSOM RamanTM Combined with Photon Tunneling Capable Of Being Configured to Be Used Also With: • Infrared Microscopes & SEMs, TEMs & FIBs WHY?

  2. Standard SPM Technologyis notmicroRaman, Optical or Electron/Ion Beam Friendly From The Top or Bottom or Both Nanonics Renishaw NSOM/Raman Combination 12.01.2003 Lens Cylindrical Piezo Probe Sample

  3. Nanonics Renishaw NSOM/Raman Combination 12.01.2003 All Nanonics SPM Technology is microRaman & Optically & Electron/Ion Beam Friendly Fiber AFM Probes 1996 Photonics Circle of Excellence Award The Award Winning NSOM/SPM-100 ConfocalTM World of Integrated Imaging 3D Flat ScannerTM • >20 mm clear optical axis • 7 mm thin scanner • mms of rough scanning and >70 micron of fine scanning in X, Yand Z directions

  4. Nanonics Renishaw NSOM/Raman Combination 12.01.2003 3D Flat Scanning Technology Permits SPM Possibilities Not Previously Achievable Tip & Sample Scanning 3D Flat Scanners All Nanonics’ Systems have the Hallmark of aFree Optical or Electron/Ion Optical Axis They also permit new avenues of flexibility both in terms of SPM instrumentation and probes

  5. Nanonics Renishaw NSOM/Raman Combination 12.01.2003 Nanonics’ Provides the Only Systems Completely Compatible with Any Available SPM Sensor Standard Silicon Cantilevers Cantilevered Multichannel & Multiwire Glass Probes Cantilevered Protruding Tip Optical Fiber Probes Cantilevered Nanoparticle Probes 70 V 0 V Cantilevered Nanopipettes for Gas & Liquid Chemical Delivery Deep Trench Probe

  6. Nanonics Systems are the Only SPMs that Allow for Transparent Integration of The Previously Separate Worlds of Raman and SPM Nanonics Renishaw NSOM/Raman Combination 12.01.2003 2002 Photonics Circle of Excellence Award

  7. Renishaw & Nanonics Provides For Full Integration of Instrumentation, Software & Photonic Signals Nanonics Renishaw NSOM/Raman Combination 12.01.2003 What new possibilities does this combination permit?

  8. Nanonics Renishaw NSOM/Raman Combination 12.01.2003 Lens Lens Shadow NSOM RamanTM Can OnlyBe Performed by the Complete Renishaw/Nanonics Integration • Raman Spectroscopy with CCD detection is ideal for difference spectroscopy • Nanonics has produced AFM sensors with an opaque nanoparticle exposed to the optical axis • Shadow NSOM Uses the Best Attributes of the Renishaw miroRaman with the Nanometric Positioning Ability of an On line AFM

  9. Nanonics Renishaw NSOM/Raman Combination 12.01.2003 Lens Lens Scattering NSOM RamanTM Can OnlyBe Performed by the Complete Renishaw/Nanonics Integration • Only the complete integration that Renishaw and Nanonics Provides allows for Evanescent Field NSOM RamanTM • No fiber connection or software connection allows for such measurements

  10. Nanonics Renishaw NSOM/Raman Combination 12.01.2003 In addition to these New Modalities of NSOM/Raman Only a Fully Integrated Raman/AFM Allows Integrating AFM & Raman Imaging • Correlate, As in the AFM Image & Spectra Above, Silicon Strain with Topographical Position in a NanoIndentation • Correlate Carbon Nanotube AFM Topography and Electrical Properties with Raman Signature Bands • Correlate Protein Pulling with Amide I and Other Vibrational Modes • Correlate Polymer Elasticity and Other Mechanical Properties with Vibrational Frequency

  11. Nanonics Renishaw NSOM/Raman Combination 12.01.2003 All Nanonics Platforms Allow The Integration of the Worlds of Electron and Ion Optics with SPM Another First for Nanonics Nanonics Sample Scanning Obstruction Free SPM Platform Viewing the AFM sensor on- line in a SEM

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