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ECE122 – 30 Lab 2: NAND gate design using CMOS

The George Washington University School of Engineering and Applied Science Department of Electrical and Computer Engineering. ECE122 – 30 Lab 2: NAND gate design using CMOS. Ritu Bajpai September 11, 2008. Propagation Delay.

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ECE122 – 30 Lab 2: NAND gate design using CMOS

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  1. The George Washington UniversitySchool of Engineering and Applied ScienceDepartment of Electrical and Computer Engineering ECE122 – 30 Lab 2: NAND gate design using CMOS Ritu Bajpai September 11, 2008

  2. Propagation Delay • Propagation Delay is the amount of time it takes a change of input to appear as a change on the output. • Propagation Delay is measured from the 50% point on the input signal to the 50% point on the output. Input Output tpHL

  3. Transition time • High-low and low high transition times at the output of a gate are defined as tHL and tLH between the 10% and 90% points. 90% 10% tLH 90% 10% tHL

  4. Gate Delay • The load capacitance severely affects the gate delay. Inv1 Inv2

  5. Objective for our simulation • Create a NAND gate using p and n MOSFET and testing its performance. • Testing the performance of a NAND gate from SCMOS library. • Comparing the performance of the two NAND gates.

  6. Note parameters W=2.50u and L=0.25u

  7. TEST BENCH FOR NAND GATE TEST BENCH FOR THE NAND GATE TEST BENCH FOR NAND GATE NAND GATE NAND GATE NAND GATE

  8. tpHL

  9. Record the propagation delay • Record tpHL and tpLH for the NAND gate. • Record the waveform for the same. • Next we will use the same test bench for the NAND gate from the LogicGates library • Record the values of tpHL and tpLH in 2 cases.

  10. Replace your NAND gate by the NAND gate in the library LogicGates

  11. Analysis/Result • Is the rise time and fall time of each gate same, if no then why? • Is the rise time and fall time of both the gates similar to each other, if no then what could be the probable reasons for the difference?

  12. Analysis/Result • Repeat the simulation to create a NOR gate using CMOS. • In the test circuit, replace your NOR gate by the NOR gate in SCMOS library. • Record the waveform in the two cases and make the similar observations as you made for NAND gate.

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