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RICH LVL-1 problem

RICH LVL-1 problem. Almost problem comes from the Int-R chip. We have investigated the problem using a test of the Int-R chip. Dead channel Offset on the trigger output of the Int-R chip 90% of dead channel has offset(200mV) These chips should be rejected by the chip test.

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RICH LVL-1 problem

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  1. RICH LVL-1 problem Almost problem comes from the Int-R chip. We have investigated the problem using a test of the Int-R chip • Dead channel • Offset on the trigger output of the Int-R chip • 90% of dead channel has offset(200mV) • These chips should be rejected by the chip test. • Broken amp on the LVL-1 Board • Hot channel • Noise from the Int-R chip Int-R chip

  2. Noise • In the chip test, • Noise have seen. • 5M Hz • On the board, • There are 5 chips in one trigger channel. • If one of 5 chips has large noise, this channel has large noise. Large noise Small Noise Before change one chip After Add new condition to the chip test sequence. (Noise should be less than 10 mV.)

  3. Schedule • The Int-R chip test • Almost Done. • At least, 320 chips are needed • We have 300 chips now. • We will prepare 400 chips. • Remake AMU/ADC Board • Install good chips on the board • In Japan and BNL • Install and check boards at BNL • End of September (1 month)

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