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Nanonics MultiView 1000™

MultiView 1000™ Product Presentation. Nanonics MultiView 1000™. MultiView 1000™ Product Presentation. MultiView 1000 ™ Complete System. Modes of Operation. MultiView 1000™ Product Presentation. SPM modes: AFM contact AFM Intermittent contact mode STM

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Nanonics MultiView 1000™

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  1. MultiView 1000™ Product Presentation Nanonics MultiView 1000™

  2. MultiView 1000™ Product Presentation MultiView 1000 ™ Complete System

  3. Modes of Operation MultiView 1000™ Product Presentation • SPM modes: • AFM contact • AFM Intermittent • contact mode • STM • Electrical Measurements • Near Field Modes (NSOM): • Reflection • Transmission • Collection • Fluorescence • Photo-Luminescence • Far Field Methods: • Standard MicroscopeImaging • Fluorescence • Confocal

  4. Modes of Operation MultiView 1000™ Product Presentation Enabled by patented 3D- FlatScanTM Technology & Cantilevered NSOM/AFM probes

  5. Easy Integration with Optical Microscopes MultiView 1000™ Product Presentation Dual - Upright /Inverted Optical Microscope

  6. MultiView 1000 ™ fits any Optical Microscope MultiView 1000™ Product Presentation Olympus Inverted Zeiss Dual Zeiss Upright Olympus Dual

  7. Illumination Sources MultiView 1000™ Product Presentation Fiber coupler and laser • Illumination through the fiber using a Fiber Coupler • Nd-YAG Laser (532 nm) • Ar+-Laser (488 & 515 nm) • HeCd-Laser (325 nm) • Diode Laser (Vis – IR) • Femtosecond Laser

  8. Detection System MultiView 1000™ Product Presentation • Detectors on the Microscope ports • APD (Vis) • PMT (UV – VIS) • InGaAs (IR) • Fiber adapter for the connection to a Spectrometer or Monochromator • … Reflection mode detector Transmission mode detector

  9. Normal Force Feedback MultiView 1000™ Product Presentation • Standard AFM and cantilevered NSOM probes • Easy to use - standard beam-bounce feedback • All standard AFM imaging modes available • Free optical axis above and below

  10. Standard NSOM/SPM Technology MultiView 1000™ Product Presentation Cylindrical Piezo Probe is not Optical, microRaman or Electron/Ion Beam Friendly neither from the top nor bottom

  11. The MultiView 1000 ™ Technology MultiView 1000™ Product Presentation Flat Scanner Probe is Optical, microRaman or Electron/Ion Beam Friendly from the top and the bottom

  12. Nanonics 3D-Flatscan™ MultiView 1000™ Product Presentation • Only 7 mm thick • 70 mm X-Y-Z scan range • Central opening providing clear optical axis • Inertial motion positioning of sample (6 mm)

  13. Nanonics 3D-Flatscan™ with Closed Loop Sensors MultiView 1000™ Product Presentation Nanonics 3D-Flatscan ™ with X-Y closed loop sensors • Capacitive displacement sensors • Precise positioning and scanning • Additional Z-sensor available • Central opening providing clear optical axis • Inertial motion positioning of sample (6 mm)

  14. Magnetic tip placement MultiView 1000™ Product Presentation • Easy & repeatable magnetic tip mounting • Easy magnetic attachment of the mount to the scan head • Large selection of specialized tips • Non-magnet holders available

  15. Sample Scanning Confocal Imaging MultiView 1000™ Product Presentation • Illumination: Through Eyepiece • Detection: on Microscope port • Scanning: 3D-Flatscan™

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