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Scanning Probe Microscopes

Scanning Probe Microscopes. Y. Tzeng Auburn University July 2003. (Presented by Tan Zhang for ELEC 7970 instructed by Y. Tzeng, 2003). SPM Family. Scanning Tunneling Microscope - STM Atomic Force Microscope - AFM Force-Modulated AFM (FMM) Lateral Force Microscope - LFM

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Scanning Probe Microscopes

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  1. Scanning Probe Microscopes Y. Tzeng Auburn University July 2003 (Presented by Tan Zhang for ELEC 7970 instructed by Y. Tzeng, 2003)

  2. SPM Family Scanning Tunneling Microscope - STM Atomic Force Microscope - AFM Force-Modulated AFM (FMM) Lateral Force Microscope - LFM Magnetic Force Microscope - MFM Scanning Thermal Microscope - SThM Electrical Force Microscope – EFM Near-field Scanning Optical Microscope – NSOM (SNOM) . . . A Whole Family Gerd Binnig and Heinrich Rohrer http://invsee.asu.edu/Invsee/listmod.htm

  3. SPM http://invsee.asu.edu/Invsee/listmod.htm

  4. SPM Tips 4.167 mm 550 nm http://invsee.asu.edu/Invsee/listmod.htm

  5. STM http://invsee.asu.edu/Invsee/listmod.htm

  6. STM/SEM • 6 translational modes of motion; • Independent sample and STM-tip positioning; • Heating and cooling; • Temperature ranging from 60K to 1000K http://www.omicron.de/products/stm_stage/

  7. SEM-assisted STM-tip Approach http://www.omicron.de/products/mslab/uhvlab.html

  8. LT STM Three domains of charge density waves on NbSe2 at  T = 5 K in UHV,  5 nm x 5 nm,  U(gap) = 0.02 V,  I(t) = 2.55 nA). http://www.omicron.de/products/lt_stm/r_ltstm2.html

  9. AFM http://invsee.asu.edu/Invsee/listmod.htm

  10. AFM http://invsee.asu.edu/Invsee/listmod.htm

  11. AFM mode Contact mode tips makes contact with the sample; can be performed within a liquid environment; Non-contact mode cantilever vibrates near the surface of the sample; spacing is tens to hundreds of angstroms; Intermittent mode cantilever tips just barely hit or tap the sample; both liquid and air environment; for soft samples.

  12. 175 um 2500 um 20 um 9.38 um AFM Tips http://invsee.asu.edu/Invsee/listmod.htm

  13. AFM/STM Contact and non-contact AFM, and STM; Lateral (friction) force detection; Electrostatic, magnetic force imaging; Simultaneous AFM and STM detection http://www.omicron-instruments.com/products/afm_stm/

  14. AFM SEM AFM http://invsee.asu.edu/nmodules/spmmod/timetable.html

  15. AFM A soft polymer material. Density of peptides: a) 1%; b) 10%; c) 100% Field of view: 4.85 µm x 4.85 µm. http://www.pacificnanotech.com/apps/app8.htm

  16. Image of 14 nm diameter colloidal gold spheres. Image range is 4 µm X 4 µm. Image of 28 nm colloidal gold spheres. Image range is 4 µm X 4 µm. AFM-metrology http://www.pacificnanotech.com/apps/app8.htm

  17. LFM http://www.ntmdt.ru/applicationnotes/LFM/

  18. LFM Bi-Cell PSPD Quad-Cell PSPD http://invsee.asu.edu/Invsee/listmod.htm

  19. LFM and PCM Topography (left) and Lateral Force images (right) of a structured polymer material. Topography, right, and Phase Contrast, left, images of a co-block polymer. PCM – Phase Contrast Mode http://www.pacificnanotech.com/apps/app8.htm

  20. FMM http://invsee.asu.edu/Invsee/listmod.htm

  21. FMM Topographic contact AFM image (left) and FMM image (right) of CF/polymer composite. http://invsee.asu.edu/Invsee/listmod.htm

  22. MFM http://invsee.asu.edu/Invsee/listmod.htm

  23. MFM Magnetic switching of nanostructured cobalt islands http://www.ee.umd.edu/~rdgomez/cobalt_animation.htm

  24. MFM -- Domain Wall Motion of Small Permalloy Elements http://www.ee.umd.edu/~rdgomez/Permalloy.htm

  25. NSOM http://www.triple-o.de/pages/application_spm.html#snom

  26. NSOM The SNOM sensor enables convenient, non-destructive imaging of premounted IC structures. http://www.snom.omicron.de/examples/twinsnom/x-tsnom_6.html

  27. TwinNSOM http://www.snom.omicron.de/instruments/twinsnom/tech.html

  28. http://www.nanotechnologyinstitute.org/presentations/IMECE01_NANO1_Li_2.pdfhttp://www.nanotechnologyinstitute.org/presentations/IMECE01_NANO1_Li_2.pdf

  29. http://www.nanotechnologyinstitute.org/presentations/IMECE01_NANO1_Li_2.pdfhttp://www.nanotechnologyinstitute.org/presentations/IMECE01_NANO1_Li_2.pdf

  30. Fabrication of thermal microprobes with a sub-100 nm metal to metal junction INSTITUTE OF PHYSICS PUBLISHING Nanotechnology 13 (2002) 29–32 D W Lee1,4, Takahito Ono2 and Masayoshi Esashi3 http://www.nanotechnologyinstitute.org/presentations/IMECE01_NANO1_Li_2.pdf

  31. http://www.nanotechnologyinstitute.org/presentations/IMECE01_NANO1_Li_2.pdfhttp://www.nanotechnologyinstitute.org/presentations/IMECE01_NANO1_Li_2.pdf

  32. http://www.nanotechnologyinstitute.org/presentations/IMECE01_NANO1_Li_2.pdfhttp://www.nanotechnologyinstitute.org/presentations/IMECE01_NANO1_Li_2.pdf

  33. http://www.nanotechnologyinstitute.org/presentations/IMECE01_NANO1_Li_2.pdfhttp://www.nanotechnologyinstitute.org/presentations/IMECE01_NANO1_Li_2.pdf http://arjournals.annualreviews.org/doi/full/10.1146/annurev.matsci.29.1.505;jsessionid=igdg5icQTWH9

  34. Summary

  35. Summary – cont’d

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