'Metrology' presentation slideshows

Alain C. Diebold

Metrology and Characterization Requirements and Challenges for the Nano-World of Integrated Circuits And Its Overlap with Nano Technology and Science. Alain C. Diebold. AGENDA. The ITRS Challenge Litho Metrology FEP & Interconnect Metrology Materials Characterization.

873 views • 60 slides

661 views • 52 slides

High Harmonic Generation off a Tape Drive as seed for the LPA-based FEL

High Harmonic Generation off a Tape Drive as seed for the LPA-based FEL. Physics and Applications of High Brightness Beams: Towards a Fifth Generation Light Source Monday 2013-03-25 Jeroen van Tilborg LOASIS program, LBNL. Acknowledgements.

629 views • 43 slides

CARS Microscopy of Colloidal Gels

CARS Microscopy of Colloidal Gels. Evangelos Gatzogiannis. CARS (Coherent Anti-Stokes Raman). CARS Microscopy. M. D. Duncan, J. Reintjes, and T. J. Manuccia Optics Letters, Vol. 7, Issue 8, pp. 350- (Deuterated Onion Cells) Revived by Zubmusch, Xie in 1999. CARS Advantages.

621 views • 42 slides

O utline

O utline. SADC Protocols Introduction: key issues for trade in service Private sector participation in negotiations and regulator negotiators Key issues towards liberalization (for private sector and regulators) Policy issues Offensive and Defensive interest .

448 views • 27 slides

The National Standards and Quality System

The National Standards and Quality System. Jean-Louis Racine The World Bank Cambridge, England April 19, 2007. Knowledge Economy Forum VI Technology Acquisition and Knowledge Networks. A Snapshot of the National Standards and Quality System. National metrology institute.

434 views • 25 slides

Metrology Roadmap

Metrology Roadmap. Europe Ulrich Mantz (Infineon) Dick Verkleij (Philips) Mauro Vasconi (ST) Japan Yuichiro Yamazaki (Toshiba) Kazuo Nishihagi (Technos) Korea Taiwan US Dan Herr (SRC) Steve Knight (NIST) Alain Diebold (Int. SEMATECH). Metrology Roadmap 7/12/04.

534 views • 24 slides

Metrology Roadmap 7-06

Metrology Roadmap 7-06. Europe Bart Rijpers (ASML) Marco van der Haar (Panalytical) Thomas Hingst (Infineon) Dick Verkleij (FEI- Philips) Mauro Vasconi (ST) Japan Eiichi Kawamura (Fujitsu) Yuichiro Yamazaki (Toshiba) Masahiko Ikeno (Hitachi High-Technologies)

394 views • 22 slides

Metrology Roadmap

Metrology Roadmap. 2008. Metrology Roadmap 2008. Europe Thomas Hingst ( Qimonda ) Bart Rijpers (ASML) Japan Eiichi Kawamura (Fujitsu) Masahiko Ikeno (Hitachi High-Technologies) Yuichiro Yamazaki (Toshiba) Korea Chul Hong Kim ( Hynix ) Soobok Chin (Samsung)

515 views • 21 slides

Metrology Roadmap 2003 Update and ISMT Project Plans

Metrology Roadmap 2003 Update and ISMT Project Plans. Europe Ulrich Mantz (Infineon) could not travel Mauro Vasconi (ST) on phone Japan Yuichiro Yamazaki (Toshiba) Kazuo Nishihagi (Technos) Korea Taiwan US Steve Knight (NIST) Alain Diebold (Int. SEMATECH)

346 views • 20 slides

Saudi Energy Efficiency program

Saudi Energy Efficiency program. Working session on the implementation of the modified Saudi standard SASO 2663/2012 Energy labeling and minimum energy performance requirements for air-conditioners. 14 May 2013. Agenda.

289 views • 17 slides

Virtual Metrology Institute- A Reality for Small Countries

Virtual Metrology Institute- A Reality for Small Countries. LALY SAMUEL Measurement Standards Laboratory of New Zealand Industrial Research Gracefield, Lower Hutt. Brief History of Analytical Measurements in New Zealand. 1865 started as Colonial Analyst

317 views • 17 slides

Cooperative Metrology activities in SEA-EU-NET

304 views • 16 slides

International cooperation in metrology The role of the OIML Willem KOOL BIML Assistant Director

International cooperation in metrology The role of the OIML Willem KOOL BIML Assistant Director. What is the OIML ?. International treaty organization Established in 1955 Headquarters (the BIML) in Paris, France Aim is to harmonize metrological legislation worldwide

399 views • 15 slides

Design and performances of an Imager Fourier Transform Spectrometer in the UV (IFTSUV)

271 views • 13 slides

Metrology Roadmap 4-06

Metrology Roadmap 4-06. Europe Bart Rijpers (ASML) Thomas Hingst (Infineon) Dick Verkleij (FEI- Philips) Mauro Vasconi (ST) Japan Eiichi Kawamura (Fujitsu) Yuichiro Yamazaki (Toshiba) Masahiko Ikeno (Hitachi High-Technologies) Korea Soobok Chin (Samsung)

306 views • 10 slides

Metrology Roadmap 2010

Metrology Roadmap 2010. Europe Adrian Kiermasz ( Metryx ) Carlos Beitia ( CEA LETI MINATEC ) Philippe Maillot (ST) Delphine Le Cunff (ST) Japan Eiichi Kawamura (Fujitsu Semiconductor) Yuichiro Yamazaki (Toshiba) Masahiko Ikeno (Hitachi High-Tech) Korea

282 views • 9 slides

213 views • 7 slides

BANDRRI, National Database at CIEMAT (SPAIN)

197 views • 7 slides

International Technology Roadmap for Semiconductors Metrology Roadmap 2012

International Technology Roadmap for Semiconductors Metrology Roadmap 2012. Metrology Technical Working Group. Metrology Roadmap 2012 Spring attendance. Europe Carlos Beitia ( CEA LETI MINATEC ) Philippe Maillot (ST) Japan Masahiko Ikeno (Hitachi High-Tech) Korea Taiwan

247 views • 3 slides