'Path coverage' presentation slideshows

Implementation-Based Testing

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Implementation-Based Testing

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Chapter 6 Path Testing 322 235 Software Testing

Chapter 6 Path Testing 322 235 Software Testing. By Wararat Songpan ( Rungworawut ),PH.D. Department of Computer Science, Faculty of Science, Khon Kaen University. Path Testing.

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White Box and Black Box Testing

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Software Testing: Test Design

Software Testing: Test Design. Iain McCowatt http://exploringuncertainty.com iain@exploringuncertainty.com @imccowatt imccowatt. Introduction: Recap on Pre-Work. There are very many test techniques The videos provided as pre-work provided a rapid overview of some of these

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White-Box Testing

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Testing and Debugging

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Overview

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Symbolic Executing Program Paths to Adaptively Generate Test Cases

Symbolic Executing Program Paths to Adaptively Generate Test Cases. Liu Shi & Zhang Chun {liushi07, zhangchun08}@ sei.pku.edu.cn. Agenda. Introduction & Motivation Our Approach Path selection Symbolic Execution to get path info Test case generation Experimental study Project related

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Lecture 5 - Verification Tools

Lecture 5 - Verification Tools. Automation improves the efficiency and reliability of the verification process Some tools, such as a simulator, are essential. Others automate tedious tasks and increase confidence in the outcome. It is not necessary to use all the tools. Lecture Overview.

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Alpha Coverage: Bounding the Interconnection Gap for Vehicular Internet Access

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CS4311 Spring 2011 Unit Testing Dr. Guoqiang Hu Department of Computer Science UTEP

CS4311 Spring 2011 Unit Testing Dr. Guoqiang Hu Department of Computer Science UTEP. Statement Coverage Every statement gets executed at least once Every node in the CFG gets visited at least once Statement coverage is the most basic (weakest) coverage. 1. 6. 1. 6.

227 views • 14 slides

KUFA UNIVERSITY

KUFA UNIVERSITY. Department of Computer Science. Fundamentals of Software Engineering. Presented By Neamah Hassan. s/w testing. Testing The aim from testing is to identify all defects in a program

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Capricorn Transect : Lithospheric Background

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HIGH-SPEED VLSI TESTING WITH SLOW TEST EQUIPMENT

HIGH-SPEED VLSI TESTING WITH SLOW TEST EQUIPMENT. Available automatic test equipment (ATE) speed is 100-200MHz; VLSI chip speed is 0.5-1GHz. Expensive to replace the existing ATE. Besides, chip speed remains an advancing target. Existing delay test solutions insert hardware into chip

125 views • 3 slides