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Arradiance ALD/Incom MCP Test

Arradiance ALD/Incom MCP Test. Incom substrate 40µm pores, 8 deg bias, 40:1 L/D Sent to Arradiance for resistive and emissive layer application + electrode Resistance approx 750 MΩ in vacuum Arradiance tests show 50,000 gain @ 1000v Tested as a single MCP + Phosphor

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Arradiance ALD/Incom MCP Test

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  1. Arradiance ALD/Incom MCP Test • Incom substrate • 40µm pores, 8 deg bias, 40:1 L/D • Sent to Arradiance for resistive and emissive layer application + electrode • Resistance approx 750 MΩ in vacuum • Arradiance tests show 50,000 gain @ 1000v • Tested as a single MCP + Phosphor • High resolution images and scrubbing progress.

  2. ArradianceALD/Incom MCP Test UV light 550v Bright scratch on phosphor 1000v background, no obvious hotspots other than phosphor defects

  3. SSL-UCB, ALD/Incom MCP Test Multifiber pattern fades as the MCP gain is increased Gain is quite uniform

  4. SSL-UCB, ALD/Incom MCP Test We can see the 40µm pores We can see the Hex boundary distortions are uneven 800v MCP 2900v screen

  5. ALD/Borosilicate MCP Test We can see the Hex boundary distortions cause gain nonuniformity 550v MCP 1000v MCP

  6. Arradiance conduction and emission films 10 mm pore NO LEAD glass substrate, 40:1 L/D, Bias = 880V, Iout~0.4 pA/pore, gain under electron bombardment Tremsin - LAPD workshop Arradiance, Inc.

  7. Starts at Bias = 700V, gain x1000, 0.6µA, change to 850v, 0.8µA at 0.03C/cm2 Quite stable after 0.03 C/cm2, vs 0.2 C/cm2 for normal MCP UV Scrub 25mm 40µm 40:1 ALD MCP Note: no pre-vacuum bake

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